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Created on LEED Interpretation

ID#

li-5168

Credit NameEAc1 - Optimize energy efficiency performance
Credit CategoryEnergy & atmosphere
International ApplicableNo
Campus ApplicableNo

Rating System

LEED O+M: Existing Buildings

Rating System Version

v3 - LEED 2009, v3 - LEED 2008

Inquiry

We are writing this CIR to propose an alternate method for calculating the energy efficiency due to the limitations we see in the new LEED-EBOM for Semiconductors. We are considering going with Option C2 because of following reasons but still encountering unclear direction in the RG for calculating the historical baseline. Offline calculator for Option C2 is not available in LEED-EBOM RG & LEED-Online template. The Option C2 instruction is in a way similar to the old LEED-EBv2 instruction. As such, we are proposing to use the methods & calculations defined in the LEED-EBv2 in calculating our energy efficiency based on kwhr/space actual utilization (excluding idle spaces). Reasons: Our project covers a semiconductor assembly & test facilities, it caters for various & multiple type\'s semiconductor products that changes from time-to-time. Our operation started in 2001 & the total area of the building was 301ksf. Manufacturing & office spaces represent 60% & 26% of the total area respectively. The manufacturing floor spaces were not occupied completely when its operation started, over the years the manufacturing space had gradually been occupied & made some minor space conversion to cater for the growing demand. The space utilization varies dynamically as the products converts from one technology to another - that normally last for a couple of months; manufacturing equipment layout will require changes that will induce temporary idle spaces. We performed manufacturing tool compaction activities to allow producing more products on the same floor space with the intention to prevent building more structures & facilities. It was done without sacrificing the air ventilation & ergonomic concerns of the employees working in the production area. Despite the efforts done to reduce consumption & improve plant efficiency, the plant faces problems in meeting EAc1 of the LEED-EBOM RG. Under Option A, obtaining an Energy Star Rating in the Portfolio Manager is not possible for semiconductor plants for the reasons that said "building type" is not available in the EPA system. Also, our semiconductor manufacturing floor areas categorized as "others space type" in the Portfolio Manager exceeded the allowable percentage space limit in the system, thus making it un-ratable. In Option B, the RG provides two options either by demonstrating 19% efficiency as benchmarked against a national median or use USGBC LEED-Online supplementary offline calculator. In comparing our buildings energy usage with other buildings of similar space types & similar climate, we\'re experiencing problems in conducting the benchmarking due to the fact that we don\'t have similar processes & products even within our company; most of our other plants are not located within the same geographical region. Our manufacturing plants are not alike when it comes to production mix, each sites produces different products. Today, there is no energy benchmark available for semiconductor facilities. Under the Eligibility tab of the offline calculator Question C-4, it states that "If the Energy Star rating was unavailable because of building characteristics or activities is over 10% of the project building\'s space, as entered on Portfolio Manager, classified as "data center", "Service", or other unclassified - then it directs us to use the general option C instructions in the RG & don\'t use the offline calculator. Our manufacturing space accounts to 60% of the total area & prohibits us from using the offline calculator. Option C1 requires applicants to obtain its weather-normalized EUI in the Portfolio Manager and compare it to a national EUI average source in CBECS. Similar to EPA, CBECS doesn\'t have any modeled data that represents semiconductor EUI, as such comparative benchmarking is again not possible.

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